JPH0257707B2 - - Google Patents

Info

Publication number
JPH0257707B2
JPH0257707B2 JP59267712A JP26771284A JPH0257707B2 JP H0257707 B2 JPH0257707 B2 JP H0257707B2 JP 59267712 A JP59267712 A JP 59267712A JP 26771284 A JP26771284 A JP 26771284A JP H0257707 B2 JPH0257707 B2 JP H0257707B2
Authority
JP
Japan
Prior art keywords
film
contact hole
polycrystalline silicon
resistance
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP59267712A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61144872A (ja
Inventor
Katsuya Okumura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP59267712A priority Critical patent/JPS61144872A/ja
Publication of JPS61144872A publication Critical patent/JPS61144872A/ja
Publication of JPH0257707B2 publication Critical patent/JPH0257707B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H10D62/83Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/60Electrodes characterised by their materials
    • H10D64/62Electrodes ohmically coupled to a semiconductor

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • Electrodes Of Semiconductors (AREA)
JP59267712A 1984-12-19 1984-12-19 半導体装置 Granted JPS61144872A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59267712A JPS61144872A (ja) 1984-12-19 1984-12-19 半導体装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59267712A JPS61144872A (ja) 1984-12-19 1984-12-19 半導体装置

Publications (2)

Publication Number Publication Date
JPS61144872A JPS61144872A (ja) 1986-07-02
JPH0257707B2 true JPH0257707B2 (en]) 1990-12-05

Family

ID=17448500

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59267712A Granted JPS61144872A (ja) 1984-12-19 1984-12-19 半導体装置

Country Status (1)

Country Link
JP (1) JPS61144872A (en])

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4884123A (en) * 1987-02-19 1989-11-28 Advanced Micro Devices, Inc. Contact plug and interconnect employing a barrier lining and a backfilled conductor material
JP2695812B2 (ja) * 1988-01-29 1998-01-14 株式会社東芝 半導体装置
JPH0228320A (ja) * 1988-04-06 1990-01-30 Fujitsu Ltd 半導体装置の製造方法
JPH0283978A (ja) * 1988-09-20 1990-03-26 Nec Corp 半導体装置
JP2821157B2 (ja) * 1989-01-30 1998-11-05 株式会社日立製作所 配線形成方法
JPH06275655A (ja) * 1993-03-24 1994-09-30 Mitsubishi Electric Corp 半導体装置及びその製造方法
JPH08139318A (ja) * 1994-11-11 1996-05-31 Fuji Electric Co Ltd 横型電界効果トランジスタ
KR0167274B1 (ko) * 1995-12-07 1998-12-15 문정환 씨모스 아날로그 반도체장치와 그 제조방법
JP2765569B2 (ja) * 1996-08-02 1998-06-18 株式会社日立製作所 半導体装置の製造方法
TW531684B (en) 1997-03-31 2003-05-11 Seiko Epson Corporatoin Display device and method for manufacturing the same
JP3362008B2 (ja) * 1999-02-23 2003-01-07 シャープ株式会社 液晶表示装置およびその製造方法

Also Published As

Publication number Publication date
JPS61144872A (ja) 1986-07-02

Similar Documents

Publication Publication Date Title
US4392150A (en) MOS Integrated circuit having refractory metal or metal silicide interconnect layer
US4551908A (en) Process of forming electrodes and interconnections on silicon semiconductor devices
US5278099A (en) Method for manufacturing a semiconductor device having wiring electrodes
US4862244A (en) Semiconductor device having Schottky barrier between metal silicide and silicon
JP2577342B2 (ja) 半導体装置およびその製造方法
JPH0257707B2 (en])
JPS6213819B2 (en])
JP3023853B2 (ja) 半導体装置の製造方法
EP0209654B1 (en) Semiconductor device having wiring electrodes
JPH0562456B2 (en])
US5858868A (en) Method of manufacturing a laminated wiring structure preventing impurity diffusion therein from N+ and P+ regions in CMOS device with ohmic contact
JPS624371A (ja) 耐熱金属珪化物を用いてvlsi回路を製造する方法
JPH0527975B2 (en])
JPH053750B2 (en])
JPH07111969B2 (ja) 半導体装置の製造方法
JPS63301556A (ja) Bi−CMOS半導体装置
JP3114307B2 (ja) 半導体装置およびその製造方法
JPH0677162A (ja) 半導体装置とその製法
JPS63265448A (ja) Mos型半導体装置の製造方法
JPH0222544B2 (en])
JPH06104428A (ja) 半導体装置及びその製造方法
JPH06291077A (ja) 半導体装置及びその製造方法
JPH0235773A (ja) 半導体装置
JPS62115776A (ja) 半導体装置の製造方法
JPH06295879A (ja) 半導体装置の製造方法

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees